RENISHAW : announces more new products for EMO Hannover 2011

Renishaw, the global engineering technologies company, is announcing more new products that will be demonstrated at the EMO Hannover exhibition taking place in Germany, from 19th - 24th September. These include touch probes and software systems that will aid process control on CNC machine tools and a new surface finish measurement probe for co-ordinate measuring machines (CMMs).

These new metrology products will be demonstrated alongside other significant products already announced, including a radical new alternative to traditional dedicated gauging, a new range of additive manufacturing technologies and a 5-axis probe for CMMs.

New system allows multiple tool setting and inspection probes on CNC machine tools

At EMO Hannover, Renishaw is introducing significant new additions to its range of radio transmission probe systems, including an interface that allows multiple probe installations on the same machine tool, and a new compact tool setting probe with radio signal transmission which is ideal for larger machines.

The new RMI-Q radio transmission interface allows up to four separate tool setting or spindle-probes with radio transmission to be operated on the same CNC machine, making it an excellent choice for fitment onto CNC machining centres, or machines with rotary tables or twin pallets. Renishaw's new RTS contact tool setting probe with radio transmission is a robust, compact and cable-free product which does not restrict table movement. It offers users fast and accurate tool measurement, including tool length and diameter of milling cutters, twist drills and end mills, plus broken tool detection.

New version of PC based probing software for machining centres

Visitors to EMO 2011 will see that Productivity+™ is a unique software solution for the integration of measurement and process control functionality into CNC machining programs. Providing significant advantages over traditional methods, Productivity+ eliminates the requirement for the manual addition of probing cycles into G-code, instead using ‘point and click' feature selection from imported solid models within an interface immediately familiar to existing CAM users.

Already the most powerful tool available for using on-machine measurement to control manufacturing processes, Productivity+ version 1.90, available in autumn 2011, builds further on existing functionality and flexibility and includes more features for Constructed Statements, enhanced multi-axis capability, improved reporting capability, and more Custom Macro functionality.

New sensor allows fully automated surface finish measurement on CMMs

Renishaw has added a new probe option for its revolutionary REVO® five-axis measurement system, which for the first time, allows surface finish inspection to be fully integrated within CMM measurement routines. With a measurement capability of 6.3 to 0.05 Ra, the SFP1 surface finish probe provides a unique ‘single platform' that will eliminate the need for hand-held sensors, or the necessity to move parts to costly dedicated surface finish measuring machines, reducing labour costs and inspection lead times. Visitors to EMO Hannover will see that CMM users will now be able to automatically switch between part scanning and surface finish measurement, with analysis all contained in a single measurement report.

NIKON METROLOGY, INC. TO PRESENT XTREME SCANNING INNOVATION BRIEF AT QUALITY EXPO

Nikon Metrology announced that Alex Lucas, Business Development Manager of Scanning Products, will be presenting the Xtreme Scanning Innovation Brief at the Quality Show in Chicago.  Over the past few decades, laser scanners have grown from a novelty research topic, to being a critical component of the design process.  Now they are the lynchpin to scores of manufacturers' rapid inspection needs. Nikon Metrology offers a host of scanners that collect point cloud data at blistering rates unlocking the true potential of laser scanners as they have grown from novelty to necessity. Real-life examples of how productivity has increased and costs reduced will be discussed.

This presentation will cover:
• Latest advancements in CMM & handheld scanners
• Advantages of laser scanners - Typical applications
• Nikon Metrology's product portfolios
• Video demonstration of Nikon Metrology's Focus Inspection software
Intended audience: Quality Engineers, Design Engineers, Manufacturing Engineers, Plant Managers, CMM Programmers and Operators, Articulated Arm Operators
About the Speaker:
Alexander Lucas, Business Development Manager, Nikon Metrology, Inc.

Alexander Lucas is a Business Development Manager for Nikon Metrology, Inc. Having started with the company after graduating from the University of Michigan's College of Engineering, Lucas has had an opportunity to become proficient at a variety of metrology systems under the Nikon Metrology umbrella.  He is also quite skilled at imparting his knowledge for maximum benefit!